Scanning steel junctions using eddy current probe

Studying of various nanolithography methods by using Scanning Probe Microscope

The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. In this paper, a qualified overview of diverse lithog...

Standard Flaws for Eddy Current Probe

Calibration procedures for eddy current inspections often involve the use of artifact standards containing manufactured flaws. The manufactured flaw is assumed to be a good approximation of the type of flaw being sought during the inspection. These manufactured flaws are most often produced by electrical dis charge machining (EDM) , milling, or the controlled growth of fatigue cracks. With simp...

Corrosion Steel Inspection under Steel Plate Using Pulsed Eddy Current Testing

Pulsed eddy current inspection techniques were derived from the conventional eddy current testing technology, based on the fundamental principle of an eddy current coil, but using periodic ultrasound pulses. The authors first introduce the principle of pulsed eddy current inspection and some experimental measurement results using pulsed eddy current equipment. This technology can be applied to ...

Studying of various nanolithography methods by using Scanning Probe Microscope

The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. In this paper, a qualified overview of diverse lithog...

Measuring electrical current during scanning probe oxidation